Detection and Mitigation of Flux Trapping in Superconducting Digital Electronics

Yokohama National University
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Education and Culture Hall, Yokohama National University, Yokohama, Japan


Workshop Details

Flux trapping remains a longstanding and unresolved challenge in the development of large-scale superconducting circuits. This workshop aims to foster in-depth discussions among researchers worldwide to explore methods for detecting and mitigating flux trapping in superconducting circuits. The workshop will be held in a hybrid format, offering both on-site and online participation options.
Dates and Time: Friday, December 13, 2024, 9:00 – 17:10 (JST)

Venue: Education and Culture Hall, Yokohama National University, Yokohama, Japan

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Online link:

https://zoom.us/j/92289651469?pwd=brdFrW0JOLMSr2BGJztiNzlGisW6j4.1

 



Presentations

Title Author(s) Location
Wide-field quantitative imaging of superconducting vortices using diamond quantum sensors Kento Sasaki Department of Physics, The University of Tokyo
Overview of large-scale AQFP efforts and FSDL plans at Yokohama National University Christopher L. Ayala Yokohama National University
High-Frequency Electrodynamics of Trapped Vortices in Superconductors Chung-Yang Wang, Jingnan Cai, Steven M. Anlage Quantum Materials Center, Department of Physics, University of Maryland
Experimentally detecting and mitigating trapped flux at NIST Pete Hopkins NIST Superconductive Electronics Group
Superconducting digital circuits fabrication process at AIST Fumihiro China, Shuichi Nagasawa, Mutsuo Hidaka, Fuminori Hirayama, Koh-ichi Nittoh, and Go Fujii Global Research and Development Center for Business by Quantum-AI Technology (G-QuAT)
National Institute of Advanced Industrial Science and Technology (AIST)
Mitigation of Flux Trapping in Large- Format, Low-Tc Analog SQUID Arrays Kent Irwin Yokohama National University
Optimizing Scanning SQUID Microscopy for Efficient Data Acquisition Kam Moler Yokohama National University
Research activities on superconducting digital electronics at NICT Hirotaka Terai, Shigeyuki Miyajima, Masahiro Yabuno, and Shigehito Miki NICT - National Institute of Information and Communications Technology
Toward Trapped Flux Insensitive SFQ Logic Circuits Stephen Whiteley Synopsys, Inc.

 


Sponsors

FDSL Workshop Participants

Type
General Event
Admission
Free
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